Hot slumping glass technology and integration process to manufacture a grazing incidence scaled prototype for the IXO telescope modules

Ghigo, M. , Basso, S. , Canestrari, R., Conconi, P., Citterio, O. , Civitani, M. , Dell'Orto, E., Gallieni, D., Pareschi, G. , Parodi, G., Proserpio, L. , et al.

Ghigo, M. , Basso, S. , Canestrari, R., Conconi, P., Citterio, O. , Civitani, M. , Dell'Orto, E., Gallieni, D., Pareschi, G. , Parodi, G., Proserpio, L. , Spiga, D.

2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, Volume 7437 (2009)., article id. 74370P, 15 pp. (2009).

Citations: 14     I.F.: 8.17        Citations/Authors: 1.17

  Surface smoothness requirements for the mirrors of the IXO x-ray telescope

Spiga, D. , Pareschi, G.

2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, Volume 7437 (2009)., article id. 74371M, 10 pp. (2009).

Citations: 7     I.F.: 7        Citations/Authors: 3.5

On the compliance of Simbol-X mirror roughness with its effective area requirements

Spiga, D. , Basso, S. , Cotroneo, V. , Pareschi, G. , Tagliaferri, G.

2009, SIMBOL-X: FOCUSING ON THE HARD X-RAY UNIVERSE: Proceedings of the 2nd International Simbol-X Symposium. AIP Conference Proceedings, Volume 1126, pp. 41-43 (2009).

Citations: 6     I.F.: 6        Citations/Authors: 1.2

Design and development of the optics system for the NHXM Hard X-ray and Polarimetric Mission

Pareschi, Giovanni , Tagliaferri, Gianpiero , Attinà, Primo, Basso, Stefano , Borghi, Giuseppe, Citterio, Oberto , Civitani, Marta , Cotroneo, Vincenzo , Negri, Barbara, Sironi, Giorgia , Spiga, Daniele , et al.

2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, Volume 7437 (2009)., article id. 743704, 12 pp. (2009).

Citations: 7     I.F.: 4.31        Citations/Authors: 0.54

Simbol-X Hard X-ray Focusing Mirrors: Results Obtained During the Phase A Study

Tagliaferri, G. , Basso, S. , Borghi, G., Burkert, W., Citterio, O. , Civitani, M. , Conconi, P., Cotroneo, V. , Freyberg, M., Garoli, D., Gorenstein, P., et al.

Tagliaferri, G. , Basso, S. , Borghi, G., Burkert, W., Citterio, O. , Civitani, M. , Conconi, P., Cotroneo, V. , Freyberg, M., Garoli, D., Gorenstein, P., Hartner, G., Mattarello, V., Orlandi, A., Pareschi, G. , Romaine, S., Spiga, D. , Valsecchi, G., Vernani, D.

2009, SIMBOL-X: FOCUSING ON THE HARD X-RAY UNIVERSE: Proceedings of the 2nd International Simbol-X Symposium. AIP Conference Proceedings, Volume 1126, pp. 35-40 (2009).

Citations: 5     I.F.: 1.84        Citations/Authors: 0.26

Effects of small oscillations on the effective area

Cotroneo, V. , Conconi, P., Cusumano, G., Pareschi, G. , Spiga, D. , Tagliaferri, G.

2009, SIMBOL-X: FOCUSING ON THE HARD X-RAY UNIVERSE: Proceedings of the 2nd International Simbol-X Symposium. AIP Conference Proceedings, Volume 1126, pp. 88-90 (2009).

Citations: 2     I.F.: 1.33        Citations/Authors: 0.33

Optimization of the reflecting coatings for the New Hard X-Ray Mission

Cotroneo, V. , Pareschi, G. , Spiga, D. , Tagliaferri, G.

2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, Volume 7437 (2009)., article id. 743717, 12 pp. (2009).

Citations: 1     I.F.: 1        Citations/Authors: 0.25

Hard x-ray reflectivity measurement of broad-band multilayer samples

Cotroneo, V. , Bruni, R., Gorenstein, P., Pareschi, G. , Romaine, S., Spiga, D. , Zhong, Z.

2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, Volume 7437 (2009)., article id. 74371Q, 11 pp. (2009).

Citations: 1     I.F.: 0.43        Citations/Authors: 0.14

Background Rejection of Charged Particles in the Simbol-X Telescope: Preliminary Study of Protons Scattering

Dell'Orto, E., Barbera, M., Bulgarelli, A., Fioretti, V., Malaguti, G., Mineo, T., Pareschi, G. , Rigato, V., Spiga, D. , Tagliaferri, G.

2009, SIMBOL-X: FOCUSING ON THE HARD X-RAY UNIVERSE: Proceedings of the 2nd International Simbol-X Symposium. AIP Conference Proceedings, Volume 1126, pp. 72-74 (2009).

Citations: 1     I.F.: 0.3        Citations/Authors: 0.1

Enabling deposition of hard x-ray reflective coatings as an industrial manufacturing process

Garoli, Denis, Marchi, Enrico Boscolo, Mattarello, Valentina, Spiga, Daniele , Tagliaferri, Gianpiero , Pareschi, Giovanni

2009, Proceedings of the SPIE, Volume 7360, id. 73600U (2009).

Technologies for manufacturing of high angular resolution multilayer coated optics for future new hard x-ray missions: a status report

Borghi, G., Vernani, D., Marchi, E.Boscolo, Citterio, O. , Grisoni, G., Kools, J., Marioni, F., Orlandi, A., Ritucci, A., Rossi, M., Salmaso, G., et al.

Borghi, G., Vernani, D., Marchi, E.Boscolo, Citterio, O. , Grisoni, G., Kools, J., Marioni, F., Orlandi, A., Ritucci, A., Rossi, M., Salmaso, G., Valsecchi, G., Basso, S. , Pareschi, G. , Spiga, D. , Tagliaferri, G. , Negri, B.

2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, Volume 7437 (2009)., article id. 74370W, 10 pp. (2009).

Thin gold layer in Ni electroforming process: optical surface characterization

Sironi, G. , Spiga, D. , Pareschi, G. , Missaglia, N., Paganini, L.

2009, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV. Edited by O'Dell, Stephen L.; Pareschi, Giovanni. Proceedings of the SPIE, Volume 7437 (2009)., article id. 743718, 12 pp. (2009).